Using a newly developed nanoscale deformation device, atomic scale and time-resolved dislocation dynamics were captured in situ under a transmission electron microscope during the deformation of a Pt ultra-thin film with truly nanometer grains (diameter d<∼10nm). It was demonstrated that dislocations were highly active even in such tiny grains. For the larger grains (d∼10nm), full dislocations dominate and their evolution sometimes leads to the formation, destruction, and reformation of Lomer locks. In smaller grains, partial dislocations generating stacking faults were prevalent.

In situ Observation of Dislocation Behavior in Nanometer Grains. L.Wang, X.Han, P.Liu, Y.Yue, Z.Zhang, E.Ma: Physical Review Letters, 2010, 105[13], 135501