Dissociated 60 dislocations were imaged by means of high-resolution transmission electron microscopy. On the basis of the separation of partial dislocations, a room-temperature stacking fault free-energy of 40mJ/m2 was deduced. This value corresponded well with results that had been obtained by using the weak-beam technique; where thicker foils had been used. Together with results for other materials, this indicated that the determination of the stacking-fault energy by means of high-resolution transmission electron microscopy was possible if the stacking-fault energy was not too low, and if 60 dislocations were used for the analysis.

B.Weiler, W.Sigle, A.Seeger: Physica Status Solidi A, 1995, 150[1], 221-5