Transmission electron microscopy was used to study dislocations which had dissociated according to:

±b  a/2<110> → a/6<211> + a/6<121>

during deformation at room temperature. This work described the case of a dipole of dissociated dislocations in order to check a method for analysing the images of dissociated dislocations formed in kinematic contrast, and to emphasize the influence of thin foil surfaces upon the dissociation equilibrium and its magnitude with respect to the ductility of CdTe. This appeared to be at the origin of the scatter in the literature stacking fault energy values, γ{111}, for a/6<211>.

TEM Image of Dissociated Dislocation Dipoles in CdTe. A.Orlova, J.P.Rivière, J.Castaing: Revue de Physique Appliqué, 1985, 20[7], 449-55