Secondary ion mass spectrometry was used to study the diffusion of Al into single crystals at 827 to 1178K. It was found that the results could be described by:

D (cm2/s) = 1 x 103 exp[-3.45(eV)/kT]

P.Dorner, W.Gust, A.Lodding, H.Odelius, B.Predel U.Roll: Acta Metallurgica, 1982, 30[5], 941-6

The best linear fits to the solute diffusion data ([93] to [120]) yield:

H: Ln[Do] = 0.89E – 33.6 (R2 = 0.92); Li: Ln[Do] = 1.06E – 18.8 (R2 = 0.95);

Sb: Ln[Do] = 0.30E – 14.5 (R2 = 0.63)