Theoretical investigations of point defects in this material were used to estimate the point defect populations that resulted from electron irradiation, as well as their subsequent behavior during annealing. It was noted that Ni vacancies, and Ni-Ni dumb-bell interstitials with 2 different configurations, predominated. With increasing temperature, most of the interstitials which incorporated Al atoms changed into Ni-Ni dumb-bells. The latter underwent a low-temperature long-range migration which was governed by 2 distinct activation enthalpies. The Ni vacancies migrated at considerably higher temperatures. The predictions of this analysis were in excellent agreement with experimental data. The study of materials which contained Ti or Ta additions showed that these elements trapped both interstitials and vacancies.

Recovery of Radiation-Induced Defects in Ni3Al Intermetallics. Dimitrov, C., Tarfa, T., Dimitrov, O.: Physics of Metals and Metallography, 1996, 82[1], 78-81