The de-focused convergent-beam electron diffraction method, with imaging plates, was used to determine the displacement vector of a stacking fault on the (1¯12) plane. The displacement vector was found to be [0.40, 0.00, -0.38].

Determination of the Displacement Vector at a Stacking Fault in TiO2 by Convergent-Beam Electron Diffraction. Yamada, S., Tanaka, M.: Journal of Electron Microscopy, 1995, 44[4], 212-8