Zinc oxide crystals were grown using hydrothermal method, and the habit faces were indexed by computing from inter-axial angles of the as grown boules. The dislocation structures were studied using synchrotron white beam X-ray topography. Grown-in dislocations as well as process-induced defects were characterized in the ZnO crystals. Knoop and Vickers micro-hardness were studied on sliced crystal plates. Chemical etching was used to study the dislocations running perpendicular to the wafer.

Growth and Process Induced Dislocations in Zinc Oxide Crystals. Dhanaraj, G., Dudley, M., Bliss, D., Callahan, M., Harris, M.: Journal of Crystal Growth, 2006, 297[1], 74-9