The diffusion of S in single crystals was investigated by using the 12S(d,p)33S nuclear reaction and a deuteron energy of 2MeV. The resultant diffusion parameters were compared with those obtained by using secondary ion mass spectrometry with a Cs+ primary ion beam. The diffusion coefficient was found to be equal to 1.1 x 10-15cm2/s at 450C and to 8 x 10-15cm2/s at 550C.

Depth Profiling Sulphur in Bulk CdTe and CdTe/CdS Thin Film Heterojunctions. D.W.Lane, G.J.Conibeer, S.Romani, M.J.F.Healy, K.D.Rogers: Nuclear Instruments and Methods in Physics Research B, 1998, 136-138, 225-30