Secondary ion mass spectrometric methods were used to study the diffusion of Al into single crystals at 827 to 1178K. The results could be described by:

D (cm2/s) = 1.0 x 103 exp[-3.45(eV)/kT]

Sims-Untersuchungen zur Volumendiffusion von Al in Ge. P.Dorner, W.Gust, A.Lodding, H.Odelius, B.Predel, U.Roll: Acta Metallurgica, 1982, 30[5], 941-6