Polycrystalline Ce0.77Nd0.23O1.885, with a relative density greater than 98%, was prepared and O diffusion experiments were performed at 750 to 1100C under an O partial pressure of 6.6kPa. Concentration profiles of O in the specimens, following diffusion annealing, were measured by means of secondary ion mass spectroscopy. The O self-diffusivity was found to be described by:

D (m2/s) = 6.31 x 10-9 exp[-53(kJ/mol)/RT]

and was in the extrinsic region. The O diffusion coefficient of Ce0.77Nd0.23O1.885 was larger than that of Ce0.8Y0.2O1.90 and was close to that of Ce0.69Gd0.31O2. The O diffusion coefficient, as obtained by using tracer methods at 700C, agreed with that calculated from the electrical conductivity of Ce0.77Nd0.23O1.885. The activation energy of the surface exchange coefficient was 94kJ/mol, and the values of the surface exchange coefficient were similar to those of stoichiometric CeO2 and ThO2.

Oxygen Self-Diffusion in Cerium Oxide Doped with Nd. M.Kamiya, E.Shimada, Y.Ikuma, M.Komatsu, H.Haneda, S.Sameshima, Y.Hirata: Journal of Materials Research, 2001, 16[1], 179-84