means of the secondary ion mass spectrometry of samples which had been deuterated in a radio-frequency plasma. It was found that, depending upon the temperature at which the samples were exposed to D, the resultant profiles reflected trapping at a concentration which was near to the dopant level, or reflected the operation of an almost Fickian diffusion process. The diffusivity in Nb-doped Fe2O3 was equal to 8.5 x 10-13cm2/s at 200C, and equal to 5 x 10-12cm2/s at 300C. The apparent diffusivity in FeO was equal to 5 x 10-13cm2/s at 300C.

A.M.Brass, A.Boutry-Forvielle, M.Aucouturier: Journal of the Electrochemical Society, 1992, 139[2], 374-6