It was demonstrated here that electron back-scattering pattern measurements, together with secondary ion mass spectrometry, could be used to study the crystallographic orientation dependence of tracer diffusivities in polycrystalline materials. The crystal orientation of single grains was determined by using a dedicated scanning electron microscope in the electron back-scattering pattern mode. The 18O isotope depth profiles were then measured, by means of secondary ion mass spectrometry, by performing tracer diffusion experiments on single grains of known orientation. The results yielded O tracer diffusivities as a function of the crystal orientation, the temperature and the Sr concentration in La2-xSrxCuO4 samples, where x was equal to 0 or 0.15, at temperatures ranging from 600 to 900C. A marked anisotropy of the O diffusivity was detected for the present dopant concentrations.

J.Claus, G.Borchardt, S.Weber, J.M.Hiver, S.Scherrer: Materials Science and Engineering B, 1996, 38[3], 251-7