The oxygen tracer diffusion coefficient was measured across the interface of a SrTiO3 bicrystal using secondary ion mass spectrometry. One part of the face of the bicrystal was subjected to Cu implantation prior to joining. The bulk and grain-boundary diffusion coefficients were 1·4 x 1018m2/s and 4·5 x 1021m3/s, respectively. The enhancement of oxygen grain boundary diffusion was found. Dislocation networks and precipitates at the interface were observed using transmission electron microscopy. The observations suggested that the predominant diffusion path was along the dislocation networks. The enhancement of oxygen diffusion in the grain boundary was attributed to the effect of the Cu-implanted layer.

Effect of Cu-Implanted Joining Interface on Oxygen Grain Boundary Diffusion in SrTiO3 Bicrystal. I.Sakaguchi, A.Watanabe, H.Haneda: Journal of the European Ceramic Society, 1996, 16[8], 907-10