Secondary ion mass spectrometry was employed to investigate diffusion of 2H implanted in hydrothermally grown single crystal ZnO. Diffusion profiles were studied after 0.5h isochronal heat treatments at 100 to 400C and evaluated using three different models: the infinite source model, a solid solubility limited model, and a trap limited model. Only the latter one reproduces closely the measured values. From this model an activation energy Ea = 0.85eV was extracted, and it was speculated that trapping may be a source of the discrepancies between the reported values of Ea in the literature.

Deuterium Diffusion and Trapping in Hydrothermally Grown Single Crystalline ZnO. K.M.Johansen, J.S.Christensen, E.V.Monakhov, A.Y.Kuznetsov, B.G.Svensson: Applied Physics Letters, 2008, 93[15], 152109