Isotopic exchange depth-profiling, using secondary ion mass spectrometry, was used to investigate O self-diffusion and surface exchange reactions. At temperatures below 700C, the activation energy for surface exchange was similar to that for bulk O diffusion in the same sample. This was approximately equal to 1eV for yttria-doped ZrO2. At temperatures greater than 700C, there was a marked increase in the activation energy for surface exchange, but there was no apparent change in bulk O transport parameters.

P.S.Manning, J.D.Sirman, J.A.Kilner: Solid State Ionics, 1996, 93[1-2], 125-32