The migration of B in implanted amorphous samples was studied by means of secondary ion mass spectrometry. By comparing the secondary ion mass spectrometric profiles with computer simulations, the diffusivity was estimated for temperatures of between 300 and 400C. It was found that the results could be described by:

D (cm2/s) = 0.00177 exp[-1.63(eV)/kT]

These diffusion parameters fitted an experimental correlation which was thought to be valid for the diffusion of all elements, except H, in amorphous alloys.

Boron Diffusion in Co74Ti26 Amorphous Alloy. F.La Via, K.T.F.Janssen, A.H.Reader: Applied Physics Letters, 1992, 60[6], 701-3