Secondary ion mass spectrometric methods were used to study the diffusion of In in single crystals at 602K to the melting point. The results could be described by:

D (m2/s) = 2.19 x 10-5 exp[-178(kJ/mol)/RT]

W.Gust, C.Ostertag, B.Predel, U.Roll, A.Lodding, H.Odelius: Philosophical Magazine A, 1983, 47[3], 395-406