The diffusion of Mn in monocrystalline samples was studied at temperatures ranging from 582 to 800K. Ion-beam sputtering and secondary ion mass spectrometry were used to determine concentration depth profiles. It was found that the results could be described by the expressions:

D (m2/s) = 4.3 x 10-5 exp[-2.01(eV)/kT]

These results were consistent with previous high-temperature data. A curvature of the overall Arrhenius plot was attributed to a contribution which arose from divacancies at high temperatures.

A.Almazouzi, M.P.Macht, V.Naundorf, G.Neumann: Physica Status Solidi A, 1998, 167[1], 15-28