Secondary-ion mass spectrometry was used to study grain boundary diffusion along (100) twist grain boundaries. The concentration profiles of Ni along twist grain boundaries with misorientation angles of 10°, Σ = 5 (36.87°) and 45°, were measured. The results could be described by:

 10°:      sDδ (m3/s) = 9.6 x 10-9exp[-245(kJ/mol)/RT]

 36.87°:      sDδ (m3/s) = 1.1 x 10-14exp[-140(kJ/mol)/RT]

 45°:      sDδ (m3/s) = 1.3 x 10-16exp[-102(kJ/mol)/RT]

Utilizing the SIMS Technique in the Study of Grain Boundary Diffusion along Twist Grain Boundaries in the Cu(Ni) System. S.M.Schwarz, B.W.Kempshall, L.A.Giannuzzi, F.A.Stevie: Acta Materialia, 2002, 50[20], 5079-84