Diffusion measurements were performed, at 870 to 1100K, in directions which were parallel or perpendicular to the c-axes of monocrystalline samples of the -phase. The diffusion profiles were determined by means of secondary ion mass spectrometry. It was found that the diffusivity in high-purity material could be described by:
D (m2/s) = 10-5exp[-3.0(eV)/kT]
The parallel/perpendicular diffusion anisotropy ratio was less than unity for the high-purity material, and was usually greater than unity for nominally pure material.
G.M.Hood, H.Zou, J.A.Roy, R.J.Schultz, N.Matsuura, J.A.Jackman: Journal of Nuclear Materials, 1996, 228[1], 43-6
Table 93
Diffusion of Hf in Monocrystals of Nominally Pure α-Zr
Direction | Temperature (K) | D (m2/s) |
|| | 1111.0 | 4.26 x 10-18 |
| 1111.0 | 3.76 x 10-18 |
|| | 1000.5 | 1.91 x 10-18 |
| 1000.5 | 1.26 x 10-18 |
|| | 873.0 | 2.31 x 10-20 |
| 873.0 | 1.41 x 10-20 |
|| | 799.5 | 3.6 x 10-23 |
| 799.5 | 4.5 x 10-23 |