The stable isotope, 30Si, was used to measure diffusion in amorphous material at 1110 to 1410C. The diffusion profiles were determined by using secondary ion mass spectroscopy. The resultant diffusion coefficients were described by:

D (cm2/s) = 3.28 x 102 exp[-6.0(eV)/kT]

G.Brebec, R.Seguin, C.Sella, J.Bevenot, J.C.Martin: Acta Metallurgica, 1980, 28[3], 327-33