Direct diffusion measurements were performed on amorphous thin films of 4%P2O5 silicate glass. The study involved the use of 67Cu radiotracer diffusion techniques combined with micro-depth profiling. The diffusivity of 67Cu in the glass, at 227 to 550C, could be described by:

D(cm2/s) = 5.3 x 10-11exp[-0.5(eV)/kT]

D.Gupta, K.Vieregge, K.V.Srikrishnan: Applied Physics Letters, 1992, 61[18], 2178-80