An investigation was made of the cathodic behavior of silicon (IV) ions in a BaF2-CaF2-SiO2 melt at 1573K. The results showed that the silicon (IV) ion was reduced, via a single-step Si4+ + 4e = Si, which was an irreversible process involving diffusion-controlled mass transfer. The diffusion coefficient for the reduction process of silicon (IV) ions in the melt was 9.76 x 10-5cm2/s at 1573K.

Electrochemical Behavior of Silicon (IV) Ion in BaF2-CaF2-SiO2 Melts at 1573K. Y.Hu, X.Wang, J.Xiao, J.Hou, S.Jiao, H.Zhuz: Journal of the Electrochemical Society, 2013, 160[3], D81-4