Neutron activation and tracer scanning methods were used to investigate lateral self-diffusion in thin films at 573 to 873K. It was found that the results could be described by:

D (cm2/s) = 4.8 x 10-9 exp[-0.14(eV)/kT]

J.J.B.Prasad, K.V.Reddy: Journal of Physics D, 1984, 17[1], 125-33