The interdiffusion coefficients of amorphous sinusoidally modulated CuxTi1-x samples were determined by monitoring the decay of the low-angle X-ray scattering intensity of Bragg satellites during annealing. Values of the diffusion

coefficient which ranged from 9 x 10-25 to 6.9 x 10-24m2/s were obtained for isothermal annealing at temperatures ranging from 413 to 503K. Overall, the diffusion data for Cu0.5Ti0.5 and Cu0.35Ti0.65 could be described by:

D(m2/s) = 1.4 x 10-19[-0.43(eV)/kT]

and

D(m2/s) = 2 x 10-20[-0.36(eV)/kT]

respectively.

A.Bruson, J.C.Y.Noubeyo: Physica Status Solidi A, 1993, 138[1], 199-206