Migration in the metallic glass was studied at 575 to 645K by using Rutherford back-scattering spectrometry. The diffusivities were deduced by fitting an error function to the tail regions of concentration profiles. Diffusion was studied in relaxed and pre-crystallized specimens. The data could be described by:

as-quenched:   D (cm2/s) = 4.68 x 10-7 exp[-1.20(eV)/kT]

relaxed:   D (cm2/s) = 8.91 x 10-7 exp[-1.23(eV)/kT]

pre-crystallized:   D (cm2/s) = 3.72 x 10-6 exp[-1.23(eV)/kT]

It was concluded that relaxation treatments had an insignificant effect upon the diffusivity.

S.K.Sharma, S.Banerjee, Kuldeep, A.K.Jain: Acta Metallurgica, 1988, 36[7], 1683-90