The migration of Ti in amorphous samples was measured, at 573 to 645K, by using secondary ion mass spectrometry. The experiments were performed on pre-relaxed specimens. The temperature dependence of the diffusivity was of Arrhenius type, and the data could be described by:

D (cm2/s) = 8.5 x 1012 exp[-3.82(eV)/kT]

S.K.Sharma, M.P.Macht, V.Naundorf: Physica Status Solidi A, 1991, 126[1], 101-8