Morphological changes in evaporated micron-sized thin stripes, under high current densities, were evaluated. Scanning force microscopy was used to image the temporal evolution of the metallic stripe, and clear evidence of electromigration was revealed by in situ observations of mass transport from cathode to anode. This transport was correlated with the formation of hillocks and voids. The spatial distribution also reflected the effect of temperature gradients.

in situ Observation of Electromigration in Micrometre-Sized Gold Stripes by Scanning Force Microscopy. P.J.De Pablo, A.Asenjo, J.Colchero, P.A.Serena, J.Gomez-Herrero, A.M.Baro: Surface and Interface Analysis, 2000, 30[1], 278-82