The behavior of Ni in monocrystalline material was investigated at 613 to 949K. Ion-beam sputtering and secondary-ion mass spectrometry were used to measure the concentration versus depth profiles. It was found that the diffusion of Ni could be described by:

D(cm2/s) = 6.2 x 10-1exp[-2.32(eV)/kT]

It was noted that these results were consistent with previously reported high-temperature tracer data. By combining the latter data with the present low-temperature results, a curvature of the Arrhenius plot was revealed. This curvature was attributed to the contribution that was made by di-vacancies at high temperatures.

A.Almazouzi, M.P.Macht, V.Naundorf, G.Neumann: Physical Review B, 1996, 54[2], 857-63

The best linear fits to the solute diffusion data ([678] to [681], [693] to [703], [717] to [722], [725] to [727], [730] to [733], [736] to [739], [756] to [758]) yield:

Ag: Ln[Do] = 0.38E – 18 (R2 = 0.86); Cu: Ln[Do] = 0.44E – 22 (R2 = 0.77);

In: Ln[Do] = 0.50E – 22.8 (R2 = 0.99); O(l): Ln[Do] = 0.26E – 8.4 (R2 = 0.79);

Zn: Ln[Do] = 0.29E – 14.4 (R2 = 0.87)