The migration of Al in polycrystalline α-Ti was investigated at 600 to 850C. Diffusion couples were prepared by ion implantation, and the concentration profiles were monitored by means of nuclear resonance broadening techniques. It was found that the results could be described by:

D (cm2/s) = 7.4 x 10-7 exp[-1.62(eV)/kT]

J.Räisänen, A.Anttila, J.Keinonen: Journal of Applied Physics, 1985, 57[2], 613-4