The temporal evolution of concentration profiles in polycrystalline α-Ti was studied at 650 to 800C. Couples were created by ion implantation, and the time-dependent concentration profiles were monitored by using nuclear resonance broadening techniques and the 30Si(p,γ)31P reaction. The results could be described by:

D (cm2/s) = 4.4 x 10-7 exp[-1.09(eV)/kT]

J.Räisänen, J.Keinonen: Applied Physics Letters, 1986, 49[13], 773-5