The tracer diffusion of 63Ni in single crystals at 1053 to 1278K was studied by means of ion-beam sputter sectioning. The diffusivities were measured parallel to, and perpendicular to, the [001] axis. The data could be described by:

63Ni[001]:     D (m2/s) = 5.07 x 10-5 exp[-2.87(eV)/kT]

63Ni||[001]:     D (m2/s) = 4.34 x 10-7 exp[-2.32(eV)/kT]

T.Ikeda, H.Kadowaki, H.Nakajima: Acta Materialia, 2001, 49[17], 3475-85