Secondary ion mass spectrometry was used to measure diffusion profiles in monocrystalline specimens of nominally pure α-phase, or polycrystalline (1-2mm) samples of ultra-pure material and doped material (50ppmFe). The results for ultra-pure material could be described by:

D (cm2/s) = 2.6 x 10-1 exp[-3.1(eV)/kT]

On the basis of the results, it was concluded that intrinsic substitutional

diffusion was normal, and that Fe was responsible for the enhanced substitutional diffusion which was observed in nominally pure Zr.

G.M.Hood, H.Zou, R.J.Schultz, J.A.Roy, J.A.Jackman: Journal of Nuclear Materials, 1992, 189[2], 226-30