Diffusion in the bulk metallic glasses, Zr46.7Be27.5Ni10Ti8.3Cu7.5 and Zr41Be22.5Ni10Ti14Cu12.5, was studied by using secondary ion mass spectrometry for concentration depth-profiling. The Hf tracer was used as a substitute for Ti because of their similar sizes and because Hf belonged to the same period. The results could be described by:

D (m2/s) = 3.76 x 1010 exp[-3.85(eV)/kT]

T.Zumkley, M.P.Macht, V.Naundorf, J.Rüsing, G.Frohberg: Journal of Metastable and Nanocrystalline Materials, 2000, 8, 135-9