The diffusion of Au and its effects on the structural, electrical and optical properties of CdTe films fabricated by using the close-spaced sublimation technique were investigated. The diffusion of Au was studied at 400 to 550C by

using energy dispersive X-ray fluorescence analysis. The Au-doped and un-doped CdTe films were characterized by using X-ray diffraction, electrical and optical absorption measurements. The temperature dependence of the diffusion coefficient of Au in CdTe films could be described by:

D (cm2/s) = 4.4 x 10-7exp[-0.54(eV)/kT]

The mechanism of Au diffusion in polycrystalline CdTe films was attributed to the fast migration of Au along grain boundaries, with simultaneous penetration into grains and settling on Cd vacancies.

T.D.Dzhafarov, M.Caliskan: Journal of Physics D, 2007, 40[13], 4003-9