The sputter sectioning technique was applied to specimens which were essentially dislocation-free, and p-type. Gaussian penetration profiles were observed, and diffusion coefficients for 1320 to 1660K were obtained. The results could be described by:

D (cm2/s) = 1.46 x 103 exp[-5.02(eV)/kT]

The results supported the suggestion that self-diffusion occurred via an extended interstitial mechanism.

H.J.Mayer, H.Mehrer, K.Maier: Institute of Physics Conference Series, 1976, 31, 186-93