Migration was studied by using deep-level transient spectroscopic techniques, or by determining the diffusion profiles of a deep level within depletion regions. It was found that the results at 873 to 1423K could be described by:

D (cm2/s) = 1.2 x 10-1 exp[-2.05(eV)/kT]

H.Nakashima, K.Hashimoto: Materials Science Forum, 1992, 83-87, 227-32