Migration was studied by using deep-level transient spectroscopic techniques, or by determining the diffusion profiles of a deep level within depletion regions. It was found that the results at 873 to 1473K could be described by:

D (cm2/s) = 9.0 x 10-3 exp[-1.55(eV)/kT]

H.Nakashima, K.Hashimoto: Materials Science Forum, 1992, 83-87, 227-32