The diffusion of zirconium in single crystal BaTiO3 was investigated in air at between 1000 and 1250C. Thin films of zirconium, deposited onto the sample surfaces by sputtering, were used as diffusion sources. The diffusion profiles were measured by SIMS depth profiling on a time-of-flight secondary ion mass spectrometer. The diffusion coefficients zirconium were given by:

D(cm2/s) = 1.1 x 101exp[−489(kJ/mol)/RT]

S.Koerfer, R.A.De Souza, H.I.Yoo, M.Martin: Solid State Sciences, 2008, 10[6], 725-34