The tracer diffusivity of O was measured by means of secondary ion mass spectrometry. The results for 1271 to 1573K could be described by:

D (m2/s) = 8.76 x 10-8exp[-287(kJ/mol)/RT]

at an O partial pressure of 0.21atm.

S.Yamaguchi, M.Someno: Transactions of the Japan Institute of Metals, 1982, 23[5], 259-66