The O tracer diffusion was measured in polycrystals at temperatures ranging from 400 to 700C, under O2 partial pressures that varied from 103 and 105Pa. The depth profiles were determined by means of secondary ion mass spectrometry. The results could be described by the Arrhenius relationship:

D (cm2/s) = 0.08 exp[-201(kJ/mol)/RT]

It was found that the diffusion coefficient was a sensitive function of the partial pressure, and increased as the partial pressure decreased.

J.L.Routbort, S.J.Rothman, J.N.Mundy, J.E.Baker, B.Dabrowski, R.K.Williams: Physical Review B, 1993, 48[10], 7505-12