The tracer diffusivity of O was measured by means of secondary ion mass spectrometry. The results for 1093 to 1455K could be described by:

D (m2/s) = 1.17 x 10-1exp[-375(kJ/mol)/RT]

The diffusivity increased, with increasing non-stoichiometry, towards O-rich compositions.

S.Yamaguchi, M.Someno: Transactions of the Japan Institute of Metals, 1982, 23[5], 259-66