Thin glass films were prepared by vacuum evaporation. The layers had the composition, P2O5-45mol%V2O5. An electrochemical cell between a solid electrolyte, Ag/Ag+ conductive glass, and thin V2O5-P2O5 films was used to measure the Ag diffusion coefficient in the layers. The results could be described by:

D (cm2/s) = 5.5 x 10-1 exp[-0.88(eV)/kT]

At room temperature, the diffusivity was small and was approximately equal to 10-15 cm2/s.

L.Jourdaine, M.Bonnat, J.L.Souquet: Solid State Ionics, 1986, 18-19, 461-6