Migration in amorphous samples was studied by means of heavy-ion Rutherford back-scattering spectroscopy. Significant mass transport was observed at very low annealing temperatures, and the data could be described by:

D(cm2/s) = 3.9 x 10-6exp[-0.58(eV)/kT]

A free volume controlled diffusion mechanism was proposed.

X.Li, H.Cheng, W.He, F.Yang: Journal of Applied Physics, 1994, 76[5], 3214-6