Self-diffusion was determined directly, using a 127mTe radiotracer, in polycrystalline and dislocated single-crystal samples. The data for grain boundaries between 280 and 390C could be represented by:

D(cm2/s) = 7.47 x 10-4 exp[-0.87(eV)/kT]

whereas those for edge dislocations, between 253 and 401C, and for screw dislocations, between 275 and 380C, were described by:

D(cm2/s) = 9.67 x 10-6 exp[-0.65(eV)/kT]

and

D(cm2/s) = 7.12 x 10-3 exp[-0.98(eV)/kT]

respectively.

R.N.Ghoshtagore: Physical Review, 1967, 155[3], 603-11