Tip-enhanced Raman spectroscopy was used to study defect-induced D-band Raman scattering in metallic single-walled carbon nanotubes with a spatial resolution of 15nm. The spatial extent of the D-band signal in the vicinity of localized defects was visualized and found to be about 2nm only. Using the strong optical fields underneath the tip, localized defects were photo-generated and a relationship between defect density and resulting D-band intensity was derived.

Tip-Enhanced Raman Spectroscopic Imaging of Localized Defects in Carbon Nanotubes. C.Georgi, A.Hartschuh: Applied Physics Letters, 2010, 97[14], 143117