Defect generation in single-walled carbon nanotubes induced by soft X-rays from a synchrotron radiation source was investigated by in situ C 1s soft X-ray absorption and recombination emission as well as ex situ micro-Raman scattering spectra. The spectral dependence of the defect generation efficiency showed that the illumination effect was resonantly enhanced in between the π* and σ* carbon 1s core absorption. A spectator Auger decay process was proposed as the most plausible mechanism for defect generation.

Defects Generation in Single-Walled Carbon Nanotubes Induced by Soft X-Ray Illumination. Y.Mera, Y.Harada, S.Arima, K.Hata, S.Shin, K.Maeda: Chemical Physics Letters, 2009, 473[1-3], 138-41