Tracer diffusion via vacancies in a simple-cubic binary alloy with short-range order was simulated using a Monte Carlo method. Extensive results for the jump frequencies and tracer correlation factor were collected for both components over the entire composition range. It was found that Arrhenius plots of the tracer diffusion coefficient had extended linear regions. Where there was an order/disorder boundary at lower temperatures the plots curve downwards. This behavior had also been found in the stoichiometric bcc alloy by Bakker et al.

Computer Simulation of Tracer Diffusion in a Concentrated Alloy with Short-Range Order. G.E.Murch: Philosophical Magazine A, 1982, 45[6], 941-56