The electron microscopy weak-beam technique for the study of small defects and dislocations was used to make micrographs of small loops in aluminium and Al–Ag alloys, GP zones and θ″ precipitates in Al-4%Cu and dislocation networks in Cu-20%Zn. An estimate of 19.5mJ/m2 was proposed for the stacking-fault energy of Cu–20%Zn on the basis of the size of extended nodes and the width of dissociated dislocations imaged under weak-beam conditions.

Observations of Lattice Defects using the Weak-Beam Technique. P.Guyot: Journal of Microscopy, 1973, 98[2], 180-90