Glide dislocations were studied by transmission electron microscopy, using the weak-beam technique. Dislocation glide planes, Burgers vectors and types (α or β) were identified. Both α and β dislocations were found to be dissociated, with the dissociation widths corresponding to a stacking-fault energy of 9.7mJ/m2. The values of stacking-fault energy for α and β dislocations were determined separately, and were not found to be significantly different.

Dislocation Structures and Motion in II–VI Semiconductors. G.Lu, D.J.H.Cockayne, Physica B+C, 1983, 116[1–3], 646–9